Clock signal source and crystal oscillator时钟源与晶体振荡器

Clock signal source and crystal oscillator时钟源与晶体振荡器

关于Clock signal source and crystal oscillator时钟源与晶体振荡器,解释如下:

Nowadays, almost all advanced microcontrollers use a crystal oscillator as their clock source. Other options include external crystal oscillators, crystal resonators, RC oscillators, and internal clocks. The main advantages of a crystal oscillator are high frequency accuracy, high frequency stability, and low power consumption.

当前,几乎所有高端MCU都使用晶体振荡器作为它们的时钟源。其它选项包括外部晶体振荡器、晶体谐振器、RC振荡器和内部时钟。晶体振荡器的主要优点是高频率精度、高频率稳定性和低功耗。

Clock signal source and crystal oscillator时钟源与晶体振荡器

To solve common problems with crystal oscillators and to achieve high reliability, it is important to pay attention to the configuration used, the components and their values, and the layout.

为了解决晶体振荡器的常见问题,并实现其高可靠性,最重要的是我们需要注意晶振振荡电路所需正确配置、组件及规格参数和电路布线设计。

All the elements mentioned above will probably affect the correct operations of a crystal oscillator, such as crystal power dissipation, frequency stability, variations with temperature, start-up time, noise immunity, etc.

以上提到的所有因素都很有可能影响到晶振的正常工作,如:电流功耗、频率稳定性、温漂程度、启动时间、抗干扰性等。

In order to solve common problems in the use of crystal oscillators and achieve their high reliability, we need to pay attention to:

为了解决晶振在使用中的常见问题并实现晶振振荡电路的高可靠性,我们需要关注:

Clock signal source and crystal oscillator时钟源与晶体振荡器

Clock signal source and crystal oscillator时钟源与晶体振荡器Correct configuration of crystal oscillation circuit
晶振振荡电路的正确配置

Clock signal source and crystal oscillator时钟源与晶体振荡器Correct selection of all components of the crystal oscillation circuit and their specifications
晶振振荡电路所有组件及其规格参数的正确选择

Clock signal source and crystal oscillator时钟源与晶体振荡器The correct layout and logical design of the crystal oscillation circuit
晶振振荡电路布线设计的正确性及合理性

Clock signal source and crystal oscillator时钟源与晶体振荡器Crystal oscillator circuit stability test, including high and low temperature changes in the working environment, voltage changes, anti-electromagnetic interference ability, etc.
晶振电路稳定性测试,包括工作环境的高低温变化、晶振是否过驱或欠驱动、电压变化、抗电磁干扰能力等。

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